Proposal of a model-driven ontology for product development process interoperability and information sharing - Archive ouverte HAL
Communication Dans Un Congrès Année : 2016

Proposal of a model-driven ontology for product development process interoperability and information sharing

Résumé

The semantic interoperability of information has become increasingly important in Product Development Process (PDP) to support different phases during the product development. This article presents a proposal of an Interoperable Product Design and Manufacturing System (IPDMS) concept based on a set of engineering domain ontologies and sematic mapping approaches. The concept explores the potentials of semantic well-defined core-foundations in a Semantic Web ontology language. The formal core-foundations can be specialised to perform application view in Product or Manufacturing Model. The application view is used to support the information sharing between product design and manufacturing and verify the accordance with product requirements. A preliminary experimental has been realised, using a test case to share information from the design to manufacturing of an injection moulding plastic. As results, it was identified potential benefits and limitations. The mains contributions are: semantic interoperability during information sharing in PDP and analysis of inconsistencies in PDP.
Fichier principal
Vignette du fichier
Szejka at al. PLM.pdf (1.22 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01417620 , version 1 (15-12-2016)

Licence

Identifiants

Citer

Anderson Luis Szejka, Osiris Junior Canciglieri, Eduardo Rocha Loures, Hervé Panetto, Alexis Aubry. Proposal of a model-driven ontology for product development process interoperability and information sharing. 13th IFIP International Conference on Product Lifecycle Management (PLM), Jul 2016, Columbia, SC, United States. pp.158-168, ⟨10.1007/978-3-319-54660-5_15⟩. ⟨hal-01417620⟩
362 Consultations
505 Téléchargements

Altmetric

Partager

More