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Communication Dans Un Congrès Année : 2014

Uncertainties assessment of noise parameters in D- band using in situ tuner techniques

Résumé

When transistor noise characterization becomes a difficult task at millimeter wave range, the accuracy on the resulting noise parameters is not or poorly discussed. Within this context, this paper aims to present a methodology to estimate the uncertainties related to the extraction of the four noise parameters when using in situ tuner techniques, in the 130-170 GHz frequency range. B9MW SiGe HBT from STMicroelectonics was used as a test vehicle for the noise characterization and uncertainties assessment.
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Dates et versions

hal-01402454 , version 1 (24-11-2016)

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Marina Deng, Daniel Gloria, Thomas Quémerais, Pascal Chevalier, Sylvie Lepilliet, et al.. Uncertainties assessment of noise parameters in D- band using in situ tuner techniques. IEEE International Symposium on Radio-Frequency Integration Technology, Aug 2014, Hefei, China. ⟨10.1109/RFIT.2014.6933261⟩. ⟨hal-01402454⟩
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