Analysis of laser-induced errors: RTL fault model versus layout locality characteristics - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2015

Analysis of laser-induced errors: RTL fault model versus layout locality characteristics

Résumé

Laser attacks are an effective threat against secure integrated circuits, due to their capability to inject very precise hardware faults. Evaluation of such attacks at RTL provides to designers the means to increase the security level of an IC, during the design stage and without the need to perform multiple design re-spins. An RTL laser fault model that attempts to model the locality of laser attacks, early in the design flow, has already been proposed in the literature. The current work presents detailed results on the validation of the RTL laser model, with respect to layout information for multiple designs. Furthermore we perform a statistical analysis on the RTL predictions, in order to calculate the percentage of the generated fault space that actually corresponds to local faults according to layout information.
Fichier non déposé

Dates et versions

hal-01393406 , version 1 (07-11-2016)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-01393406 , version 1

Citer

A. Papadimitriou, D. Hély, V. Beroulle, Paolo Maistri, Régis Leveugle. Analysis of laser-induced errors: RTL fault model versus layout locality characteristics. Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Mar 2015, Grenoble, France. ⟨hal-01393406⟩

Collections

UGA CNRS TIMA LCIS
83 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More