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Communication Dans Un Congrès Année : 2004

Optimisation of digitally coded test vectors for mixed-signal components

Résumé

This article proposes a technique to optimize test patterns targeting Analogue and Mixed-Signal (AMS) cores in System-On-Chip (SoC) devices. In order to render the test of these cores compatible with the test of digital ones and with the use of low-cost testers, the analogue test patterns are digitally coded. They can then be scanned into the chip where they are easily converted into the required analogue test patterns. A Computer-Aided Test (CAT) tool is used to optimize the digital coding of the desired analogue test signal. Several multiobjective optimization algorithms are considered to carry out this task, including Monte-Carlo, W.A.R.G.A (Weighted Average Ranking Genetic Algorithm) and N.S.G.A (Nondominated Sorting Genetic Algorithm). The results obtained with these different algorithms are illustrated for different analogue test signals.
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Dates et versions

hal-01392581 , version 1 (04-11-2016)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-01392581 , version 1

Citer

Ahcène Bounceur, Salvador Mir, Emmanuel Simeu. Optimisation of digitally coded test vectors for mixed-signal components. 19th Conference on Design of Circuits and Integrated Systems (DCIS'04), Nov 2004, Bordeaux, France. ⟨hal-01392581⟩

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