Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures - Archive ouverte HAL Access content directly
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Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures

Abstract

An original methodology is presented for characterizing SEE impact on ADCs performance parameters. Events produced by a pulsed laser and heavy ions are analyzed with an ADC testing dedicated software coupled with the THESIC+ tester.
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Dates and versions

hal-01376266 , version 1 (04-10-2016)

Licence

Attribution - NonCommercial - CC BY 4.0

Identifiers

  • HAL Id : hal-01376266 , version 1

Cite

V. Pouget, P. Fouillat, Raoul Velazco, D. Lewis, D. Dallet. Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures. IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Jul 2003, Monterey, CA, United States. ⟨hal-01376266⟩
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