Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2003

Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures

Résumé

An original methodology is presented for characterizing SEE impact on ADCs performance parameters. Events produced by a pulsed laser and heavy ions are analyzed with an ADC testing dedicated software coupled with the THESIC+ tester.
Fichier non déposé

Dates et versions

hal-01376266 , version 1 (04-10-2016)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-01376266 , version 1

Citer

V. Pouget, P. Fouillat, Raoul Velazco, D. Lewis, D. Dallet. Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures. IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Jul 2003, Monterey, CA, United States. ⟨hal-01376266⟩
128 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More