Comparison of topside contact layouts for power dies embedded in PCB - Archive ouverte HAL
Communication Dans Un Congrès Année : 2016

Comparison of topside contact layouts for power dies embedded in PCB

Résumé

Embedding of power semiconductor dies in PCB is a very attractive technology, especially to achieve interconnects with a very low parasitic inductance and resistance. In this paper, we focus on the contact resistance and current distribution in a large (6×6mm 2) diode embedded in PCB, as a function of the layout of its topside contact. We demonstrate that by choosing a suitable contact layout, it is possible to achieve a very low contact resistance.
Fichier principal
Vignette du fichier
article.pdf (1.36 Mo) Télécharger le fichier
presentation.pdf (4.6 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01373042 , version 1 (28-09-2016)

Identifiants

Citer

Chenjiang Yu, Cyril Buttay, Eric Labouré, Vincent Bley, Céline Combettes, et al.. Comparison of topside contact layouts for power dies embedded in PCB. ESTC, IMAPS, Sep 2016, Grenoble, France. ⟨10.1109/ESTC.2016.7764707⟩. ⟨hal-01373042⟩
212 Consultations
420 Téléchargements

Altmetric

Partager

More