A Dedicated DIC Methodology for Characterizing Plastic Deformation in Single Crystals - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Experimental Mechanics Année : 2016

A Dedicated DIC Methodology for Characterizing Plastic Deformation in Single Crystals

Résumé

This paper focuses on the development of an appropriate Digital Image Correlation (DIC) methodology based on Image Registration and dedicated for characterizing the plastic deformation in single crystals. A pure nickel single crystal specimen is plastically deformed in tension and investigated by DIC technique. Based on the measured kinematic fields, the proposed method enables to identify the slip activity on the crystal surface and to locate precisely the slip band interfaces at microscale which behave as kinematic discontinuities. The computed displacement data are projected on a well-defined physical basis containing slip details, then the strain fields can be derived directly from a set of analytical functions. The possible errors in displacement induced by this projection approach are evaluated. Finally, some results of the evaluated strain fields are presented. It demonstrates that the developed DIC methodology allows quantitative characterization of a heterogeneous deformation process and promotes further relationships to be established between slip activity and strain field evolution in single crystals.
Fichier principal
Vignette du fichier
Wang2016.pdf (595.24 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-01358974 , version 1 (03-05-2022)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

Citer

Xiaogang Wang, Jean-François Witz, Ahmed El Bartali, Abdelali Oudriss, Rian Seghir, et al.. A Dedicated DIC Methodology for Characterizing Plastic Deformation in Single Crystals. Experimental Mechanics, 2016, 56 (7), pp.1155-1167. ⟨10.1007/s11340-016-0159-9⟩. ⟨hal-01358974⟩
139 Consultations
112 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More