<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01345340</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-14T00:18:36+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Measurements of the write error rate in bit patterned magnetic recording at 100– 320 Gb/ in 2</title>
            <author role="aut">
              <persName>
                <forename type="first">M</forename>
                <surname>Grobis</surname>
              </persName>
              <idno type="halauthorid">1046332-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">E</forename>
                <surname>Dobisz</surname>
              </persName>
              <idno type="halauthorid">1046297-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">O</forename>
                <surname>Hellwig</surname>
              </persName>
              <idno type="halauthorid">1045958-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">M.E.</forename>
                <surname>Schabes</surname>
              </persName>
              <idno type="halauthorid">1045955-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">G</forename>
                <surname>Zeltzer</surname>
              </persName>
              <idno type="halauthorid">1046333-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Thomas</forename>
                <surname>Hauet</surname>
              </persName>
              <email type="md5">20c92c7eb1dc5be4e1a07636d3954618</email>
              <email type="domain">univ-lorraine.fr</email>
              <idno type="idhal" notation="string">thomas-hauet</idno>
              <idno type="idhal" notation="numeric">9284</idno>
              <idno type="halauthorid" notation="string">21792-9284</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-5637-0690</idno>
              <idno type="GOOGLE SCHOLAR">https://scholar.google.fr/citations?user=sttbwwMAAAAJ&amp;hl=fr&amp;oi=ao</idno>
              <idno type="IDREF">https://www.idref.fr/110213416</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">T.R.</forename>
                <surname>Albrecht</surname>
              </persName>
              <idno type="halauthorid">1046334-0</idno>
              <affiliation ref="#struct-424596"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Thomas</forename>
                <surname>Hauet</surname>
              </persName>
              <email type="md5">20c92c7eb1dc5be4e1a07636d3954618</email>
              <email type="domain">univ-lorraine.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2016-07-18 13:58:07</date>
              <date type="whenModified">2024-04-24 11:28:54</date>
              <date type="whenReleased">2016-07-18 14:01:57</date>
              <date type="whenProduced">2010</date>
              <date type="whenEndEmbargoed">2016-07-13</date>
              <ref type="file" target="https://hal.science/hal-01345340v1/document">
                <date notBefore="2016-07-13"/>
              </ref>
              <ref type="file" subtype="greenPublisher" n="1" target="https://hal.science/hal-01345340v1/file/Mike_300Gb_APL_2010.pdf" id="file-1345340-1426676">
                <date notBefore="2016-07-13"/>
              </ref>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="442216">
                <persName>
                  <forename>Thomas</forename>
                  <surname>Hauet</surname>
                </persName>
                <email type="md5">20c92c7eb1dc5be4e1a07636d3954618</email>
                <email type="domain">univ-lorraine.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01345340</idno>
            <idno type="halUri">https://hal.science/hal-01345340</idno>
            <idno type="halBibtex">grobis:hal-01345340</idno>
            <idno type="halRefHtml">&lt;i&gt;Applied Physics Letters&lt;/i&gt;, 2010, &lt;a target="_blank" href="https://dx.doi.org/10.1063/1.3304166"&gt;&amp;#x27E8;10.1063/1.3304166&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Applied Physics Letters, 2010, &amp;#x27E8;10.1063/1.3304166&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-1345340-1426676"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt/>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Measurements of the write error rate in bit patterned magnetic recording at 100– 320 Gb/ in 2</title>
                <author role="aut">
                  <persName>
                    <forename type="first">M</forename>
                    <surname>Grobis</surname>
                  </persName>
                  <idno type="halauthorid">1046332-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">E</forename>
                    <surname>Dobisz</surname>
                  </persName>
                  <idno type="halauthorid">1046297-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">O</forename>
                    <surname>Hellwig</surname>
                  </persName>
                  <idno type="halauthorid">1045958-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">M.E.</forename>
                    <surname>Schabes</surname>
                  </persName>
                  <idno type="halauthorid">1045955-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">G</forename>
                    <surname>Zeltzer</surname>
                  </persName>
                  <idno type="halauthorid">1046333-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Thomas</forename>
                    <surname>Hauet</surname>
                  </persName>
                  <email type="md5">20c92c7eb1dc5be4e1a07636d3954618</email>
                  <email type="domain">univ-lorraine.fr</email>
                  <idno type="idhal" notation="string">thomas-hauet</idno>
                  <idno type="idhal" notation="numeric">9284</idno>
                  <idno type="halauthorid" notation="string">21792-9284</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-5637-0690</idno>
                  <idno type="GOOGLE SCHOLAR">https://scholar.google.fr/citations?user=sttbwwMAAAAJ&amp;hl=fr&amp;oi=ao</idno>
                  <idno type="IDREF">https://www.idref.fr/110213416</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">T.R.</forename>
                    <surname>Albrecht</surname>
                  </persName>
                  <idno type="halauthorid">1046334-0</idno>
                  <affiliation ref="#struct-424596"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">3073</idno>
                <idno type="issn">0003-6951</idno>
                <idno type="eissn">1077-3118</idno>
                <title level="j">Applied Physics Letters</title>
                <imprint>
                  <publisher>American Institute of Physics</publisher>
                  <date type="datePub">2010</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1063/1.3304166</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">magnetic recording</term>
                <term xml:lang="en"> bit-error-rate</term>
                <term xml:lang="en"> switching field distribution</term>
              </keywords>
              <classCode scheme="halDomain" n="phys.cond.cm-ms">Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>We demonstrate a technique for measuring the intrinsic bit-error-rate as a function of write misregistration in bit patterned media. We examine the recording performance at bit densities of 100, 200, and 320 Gigabits per square inch ͑Gb/ in 2 ͒ and find that the on-track write misregistration margin for error rates below 10 −4 is ϳ1 / 4 of a bit length for all three densities. We demonstrate two-dimensional recording at sub 10 −4 bit error rate at 100 and 200 Gb/ in 2 and with a 10 −3 bit error rate at 320 Gb/ in 2. </p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="institution" xml:id="struct-424596" status="INCOMING">
          <orgName>HGST San Jose Research Center</orgName>
          <desc>
            <address>
              <country key="US"/>
            </address>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>