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              <p>This paper presents the simulation of a UHF RFID (Radio Frequency Identification) system for passive tags, using Advanced Design System software from Agilent Company. Temporal measurements based on a commercial RFID reader are achieved which permit to analyze and to validate the principles of communication between the reader and the tag. Also a test bench is developed to evaluate the effects of high temperature on the reliability of passive UHF RFID tags. The obtained test results show that the thermal storage has a marked effect on the performances of the RFID tags.</p>
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            <ref type="url">http://www.supmeca.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-322631" status="VALID">
          <idno type="ROR">https://ror.org/01687me48</idno>
          <orgName>Ecole Internationale des Sciences du Traitement de l'Information</orgName>
          <orgName type="acronym">EISTI</orgName>
          <desc>
            <address>
              <addrLine>Avenue du Parc, 95000 Cergy</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://eisti.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>