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Article Dans Une Revue Acta Materialia Année : 2013

Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation

Résumé

A biaxial device developed at DiffAbs beamline of the SOLEIL synchrotron facility has been employed to determine the applied strains in film substrate composites using both X-ray diffraction and digital image correlation measurements. Such an experimental combination is used for the first time to determine the yield surface of a polycrystalline thin film deposited on a polyimide substrate. In situ biaxial tensile tests under different biaxial planar load ratios were performed on W/Cu nanocomposite thin films deposited on flexible substrates. The effect of loading path on the yield stress of W/Cu nanocomposites is presented by considering a large range of proportional loadings. By comparing experimental results with theoretical models, this study reveals the brittle behaviour of W/Cu nanocomposite thin films at small deformations.

Dates et versions

hal-01293813 , version 1 (25-03-2016)

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Citer

S. Djaziri, D. Faurie, P. -O Renault, E. Le Bourhis, P. Goudeau, et al.. Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation. Acta Materialia, 2013, 61 (13), pp.5067-5077. ⟨10.1016/j.actamat.2013.04.031⟩. ⟨hal-01293813⟩
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