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Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2005

Optical properties of Si nanocrystals embedded in SiO2

I Stenger
Cc Kao
  • Fonction : Auteur
S Fisson
  • Fonction : Auteur
G Vuye
  • Fonction : Auteur

Résumé

The dielectric function of Si nanocrystals embedded in a SiO2 matrix has been determined in the 1.6-6.2 eV spectral range without any assumption on the dispersion law. The Si nanocrystals have been obtained by thermal annealing of SiOx layers yielding nanocrystals diameters of 4.5 nm and 1 nm for atomic composition values x of 1.1 and 1.9, respectively. The dielectric function of the large Si clusters exhibited three structures located at 3.5 eV, 4.2 eV, and 5.4 eV ascribed to the E-1, E-2, and E-1(') critical points, respectively. For the smaller Si clusters, the structure associated with the E-1 CP, near 3.5 eV, disappeared while those at higher energy remained present.
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Dates et versions

hal-01281578 , version 1 (02-03-2016)

Identifiants

Citer

Bruno Gallas, I Stenger, Cc Kao, S Fisson, G Vuye, et al.. Optical properties of Si nanocrystals embedded in SiO2. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2005, 72 (15), pp.155319. ⟨10.1103/PhysRevB.72.155319⟩. ⟨hal-01281578⟩
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