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Conference Papers Year : 2007

Mutation analysis for Lustre programs: Fault model description and validation

Abstract

Mutation analysis is usually used to provide an indication of the fault detection ability of a test set. It is mainly used for unit testing evaluation, but has also been extended for integration testing evaluation. This paper describes adaptation of mutation analysis to the Lustre programming language, including both unit and integration testing. This paper focuses on the fault model, which has been extended since our previous works. Validation of the fault model is presented.
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Dates and versions

hal-01272641 , version 1 (11-02-2016)

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Lydie Du Bousquet, Michel Delaunay. Mutation analysis for Lustre programs: Fault model description and validation. Testing: Academic and Industrial Conference Practice and Research Techniques. TAICPART-MUTATION 2007, Sep 2007, Cumberland Lodge, Windsor, United Kingdom. pp.176-184, ⟨10.1109/TAIC.PART.2007.27⟩. ⟨hal-01272641⟩
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