Characterization and modeling of low-frequency noise in CVD-grown graphene FETs - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2015
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hal-01235951 , version 1 (01-12-2015)

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Chhandak Mukherjee, Jorgue-Daniel Aguirre-Morales, Sebastien Fregonese, Thomas Zimmer, Cristell Maneux, et al.. Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. proceeding of the Solid State Device Research Conference (ESSDERC), 2015 45th European, Sep 2015, Gratz, Austria. ⟨hal-01235951⟩
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