Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz - Archive ouverte HAL
Article Dans Une Revue Applied Physics Letters Année : 2011

Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz

C. Klieber
  • Fonction : Auteur
K. Katayama
  • Fonction : Auteur
J. Choi
  • Fonction : Auteur
M. Yamaguchi
  • Fonction : Auteur
Thomas Pezeril
Keith A. Nelson
  • Fonction : Auteur

Résumé

Acoustic attenuation rates in vitreous silica in the 20-400 GHz frequency range have been measured using a multiple-pulse optical technique for generation of tunable multicycle acoustic waves that are detected interferometrically after traversal of the sample. The results connect the frequency ranges of several measurement methods, yielding a consistent description of the acoustic behavior. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3595275]
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Dates et versions

hal-01233830 , version 1 (25-11-2015)

Identifiants

Citer

C. Klieber, Emmanuel Peronne, K. Katayama, J. Choi, M. Yamaguchi, et al.. Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz. Applied Physics Letters, 2011, 98 (21), ⟨10.1063/1.3595275⟩. ⟨hal-01233830⟩
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