ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2015

ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER

Alexandre Boyer
He Huang
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Sonia Ben Dhia

Résumé

Past works showed that the degradation of the passive components caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This paper presents the impact of the accelerated thermal aging on the electromagnetic emission (EME) of a buck DC-DC converter. The experimental analysis indicates that the aging degradation of several passive components (electrolytic capacitor and powder iron inductor) is the main source of EME evolution. Based on experimental measurement and physical analysis, the empirical degradation models of related passive devices are proposed. The overall objective of this study is to predict the electromagnetic emission evolution of a buck DC-DC converter under a thermal aging, by using these passive device degradation models.

Domaines

Electronique
Présentation Boyer EMR DCDC Converter EMCCompo2015_v2.pdf (1.6 Mo) Télécharger le fichier
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Dates et versions

hal-01225377 , version 1 (16-11-2015)

Identifiants

  • HAL Id : hal-01225377 , version 1

Citer

Alexandre Boyer, He Huang, Sonia Ben Dhia. ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. ⟨hal-01225377⟩
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