Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomography and FIB-SEM Nanotomograhy - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of the American Ceramic Society Année : 2015

Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomography and FIB-SEM Nanotomograhy

Z. L. Yan
  • Fonction : Auteur
O. Guillon
  • Fonction : Auteur
C.L. Martin
S. Wang
  • Fonction : Auteur
C.S. Lee
  • Fonction : Auteur
F. Charlot
  • Fonction : Auteur

Résumé

Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam-Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode-Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage.

Domaines

Matériaux

Dates et versions

hal-01211348 , version 1 (05-10-2015)

Identifiants

Citer

Z. L. Yan, O. Guillon, C.L. Martin, S. Wang, C.S. Lee, et al.. Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomography and FIB-SEM Nanotomograhy. Journal of the American Ceramic Society, 2015, 98 (4), pp.1338-1346. ⟨10.1111/jace.13416⟩. ⟨hal-01211348⟩
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