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Article Dans Une Revue Microelectronics Reliability Année : 2015

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements

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hal-01180979 , version 1 (28-07-2015)

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  • HAL Id : hal-01180979 , version 1

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Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp. Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectronics Reliability, 2015. ⟨hal-01180979⟩
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