TOF-SIMS imaging of lipids on rat brain sections - Archive ouverte HAL Access content directly
Book Sections Year : 2015

TOF-SIMS imaging of lipids on rat brain sections

Abstract

Since several decades, secondary ion mass spectrometry (SIMS) coupled to time of flight (TOF) is used for atomic or small inorganic/organic fragments imaging on different materials. With the advent of polyatomic ion sources leading to a significant increase of sensitivity in combination with a reasonable spatial resolution (1–10 μm), TOF-SIMS is becoming a more and more popular analytical platform for MS imaging. Even if this technique is limited to small molecules (typically below 1,000 Da), it offers enough sensitivity to detect and locate various classes of lipids directly on the surface of tissue sections. This chapter is thus dedicated to the TOF-SIMS analysis of lipids in positive and negative ion modes on rat brain tissue sections using a bismuth cluster ion source.
Fichier principal
Vignette du fichier
4-4 MethodsMolecularBiology_TOFSIMSimaging.pdf (308.29 Ko) Télécharger le fichier
Origin : Files produced by the author(s)
Licence : Copyright

Dates and versions

hal-01170395 , version 1 (02-02-2023)

Identifiers

Cite

David Touboul, Alain Brunelle. TOF-SIMS imaging of lipids on rat brain sections. Lin He. Mass Spectrometry Imaging of Small Molecules, 1203, Springer New York, pp.21-27, 2015, Methods in Molecular Biology, 978-1-4939-1356-5. ⟨10.1007/978-1-4939-1357-2_3⟩. ⟨hal-01170395⟩
47 View
30 Download

Altmetric

Share

Gmail Facebook X LinkedIn More