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Article Dans Une Revue Mass Spectrometry Reviews Année : 2014

Cluster TOF-SIMS imaging as a tool for micrometric histology of lipids in tissue.

Résumé

Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform three-dimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization. © 2013 Wiley Periodicals, Inc. Mass Spec Rev 33: 442-451, 2014.
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Dates et versions

hal-01075080 , version 1 (16-10-2014)

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  • HAL Id : hal-01075080 , version 1
  • PUBMED : 24265115

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Claudia Bich, David Touboul, Alain Brunelle. Cluster TOF-SIMS imaging as a tool for micrometric histology of lipids in tissue.. Mass Spectrometry Reviews, 2014, 33, pp.442-451. ⟨hal-01075080⟩
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