Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement
Résumé
This paper presents an electromagnetic immunity study of a simple operational amplifier by using the on-chip measurement. With the technology of on-chip non-invasive sensor, the internal inaccessible signal (voltage/current) can be obtained accurately in time domain. This approach grants a good insight in the internal transient response caused by the external electromagnetic interference. The validity of the on-chip measurement results is discussed comparing with the off-chip measurement and simulation.
Domaines
Electronique
Fichier principal
Susceptibility_Analysis_of_an_Operational_Amplifier_Using_On-Chip_Measurement.pdf (720.64 Ko)
Télécharger le fichier
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
Loading...