In situ integrated tuner approach for load-pull measurement of Si/SiGe:C HBT at 200 GHz - Archive ouverte HAL
Article Dans Une Revue Electronics Letters Année : 2014

In situ integrated tuner approach for load-pull measurement of Si/SiGe:C HBT at 200 GHz

Résumé

Load impedance variations were obtained using an innovative integrated tuner at G-band. The 200 GHz load-pull measurements on a silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) are presented. First, the linearity of the integrated tuner is checked. Then, the main load-pull characteristics are extracted from a 0.13 × 3 μm2 emitter area SiGe HBT. The aim of this study is to provide a solution to avoid losses related to probes and commercial tuners. Thereby, from design to measurements, power setup architecture, calibration and performances at 200 GHz are performed in a non-50 Ω environment. Finally, comparisons between measurements and simulation from a high current model (HICUM) show good agreement, demonstrating the capability of the measurement approach.

Dates et versions

hal-01055077 , version 1 (11-08-2014)

Identifiants

Citer

Issam Hasnaoui, Alexandre Pottrain, Thomas Lacave, Pascal Chevalier, Daniel Gloria, et al.. In situ integrated tuner approach for load-pull measurement of Si/SiGe:C HBT at 200 GHz. Electronics Letters, 2014, 50, pp.1070-1072. ⟨10.1049/el.2014.0186⟩. ⟨hal-01055077⟩
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