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Communication Dans Un Congrès Année : 2014

Long term in-vacuum reliability testing of 980nm Laser Diode Pump Modules for Space Applications

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Electronique
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hal-01022862 , version 1 (11-07-2014)

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G. Pedroza, L. Bechou, Y. Ousten, Ls. How, O. Gilard, et al.. Long term in-vacuum reliability testing of 980nm Laser Diode Pump Modules for Space Applications. IEEE Aerospace Conference, Mar 2014, Big Sky, United States. pp. 1-14, ⟨10.1109/AERO.2014.6836254⟩. ⟨hal-01022862⟩
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