Degradation analysis of individual emitters in 808nm QCW Laser diode array for space applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2010

Degradation analysis of individual emitters in 808nm QCW Laser diode array for space applications

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Electronique
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hal-01019447 , version 1 (07-07-2014)

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O. Rehioui, L. Bechou, Y. Ousten, A. Kohl, T. Fillardet, et al.. Degradation analysis of individual emitters in 808nm QCW Laser diode array for space applications. SPIE Photonics West Conference, Conference LASE, Jan 2010, San Francisco, United States. pp.758314, ⟨10.1117/12.840671⟩. ⟨hal-01019447⟩
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