Study of elastic behavior of metallic thin films by 2D synchrotron XRD and in situ tensile testing
Résumé
Understanding the mechanical behavior of nano-structured thin films in relation to their
structure, in particular to the grain size, is of high importance for the development of
technological applications. In this work, model nanometric multilayer W/Au systems exhibiting
different structures are elaborated. These films are supported by a (thin) polyimide substrate.
Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a
X-ray diffractometer set on a synchrotron source. Transmission X-ray diffraction has been used
to study the deformations of both W and Au sublayers as a function of the applied load. This
geometry has been developed in the aim of optimizing the experiment time.
Origine : Fichiers produits par l'(les) auteur(s)
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