Reliability of submicron InGaAs/InP DHBT on Accelerated Aging Tests under Thermal and Electrical stresses
G. A. Koné
(1)
,
B. Grandchamp
(2)
,
C. Hainaut
(1)
,
F. Marc
(1)
,
C. Maneux
(1)
,
N. Labat
(1)
,
T. Zimmer
(1)
,
V. Nodjiadjim
(3)
,
M. Riet
(3)
,
J. Godin
(3)