Pulsed I(V) - Pulsed RF Measurement System for Microwave Device Characterization with 80ns/45GHz - Archive ouverte HAL
Communication Dans Un Congrès Année : 2012

Pulsed I(V) - Pulsed RF Measurement System for Microwave Device Characterization with 80ns/45GHz

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hal-01002174 , version 1 (05-06-2014)

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  • HAL Id : hal-01002174 , version 1

Citer

M. Weiss, Sebastien Fregonese, M. Santorelli, A. Kumar Sahoo, C. Maneux, et al.. Pulsed I(V) - Pulsed RF Measurement System for Microwave Device Characterization with 80ns/45GHz. European Solid-State Device Research Conference (ESSDERC), 2012, Sep 2012, Bordeaux, France. pp.189-192. ⟨hal-01002174⟩
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