Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013) - Archive ouverte HAL Accéder directement au contenu
Ouvrages Année : 2013

Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013)

Nathalie Labat
  • Fonction : Directeur scientifique
  • PersonId : 845366
François Marc
  • Fonction : Directeur scientifique
  • PersonId : 16571
  • IdHAL : frmarc
  • IdRef : 158656628
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hal-00995849 , version 1 (24-05-2014)

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  • HAL Id : hal-00995849 , version 1

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Nathalie Labat, François Marc (Dir.). Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013). Elsevier, pp.650, 2013. ⟨hal-00995849⟩
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