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Communication Dans Un Congrès Année : 2011

Time resolved imaging at low power supply on 45nm technology

D. Lewis
  • Fonction : Auteur
  • PersonId : 920577
IMS
Sylvain Dudit
  • Fonction : Auteur
Guillaume Celi
  • Fonction : Auteur
  • PersonId : 764109
  • IdRef : 173748430

Résumé

Time Resolved Imaging (TRI) allows real time imaging of transitions in CMOS gates. CMOS Technology trends has challenged this technique. Power Supply decrease has induced a strong reduction of photon emission related to MOS saturation mode and shifted emission to the infrared. In this paper we demonstrate the ability of new time resolved detector to overcome these limits allowing TRI of CMOS 45 nm device at low power supply voltage down to 0.7 Volts.

Domaines

Electronique
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Dates et versions

hal-00988376 , version 1 (07-05-2014)

Identifiants

  • HAL Id : hal-00988376 , version 1

Citer

G. Bascoul, Philippe Perdu, Kevin Sanchez, D. Lewis, Sylvain Dudit, et al.. Time resolved imaging at low power supply on 45nm technology. International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Jul 2011, Incheon, South Korea. pp.1-4. ⟨hal-00988376⟩
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