High frequency characterization at the nanoscale - Archive ouverte HAL
Communication Dans Un Congrès Année : 2013
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hal-00987965 , version 1 (07-05-2014)

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  • HAL Id : hal-00987965 , version 1

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Kamel Haddadi, Gilles Dambrine, Henri Happy, Didier Theron, Tuami Lasri. High frequency characterization at the nanoscale. 4th China-French Symposium on Functional Materials and Devices, 2013, Shanghai, China. ⟨hal-00987965⟩
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