We report systematic measurements of low frequency noise performed at room temperature in La0.7Sr0.3MnO3 (LSMO) thin films (thickness =150 nm) patterned with different lengths (50mm to 300mm) and widths (20mm to 400mm). Noise measurements were performed using two probe configuration, four probe configuration and even six probe configuration. Different 1/f noise contributions were observed for the film, for the current contacts and also for the voltage contacts. For the smallest devices, the noise spectral density of the film contribution does not follow the classical quadratic dependence with the DC voltage. The current contact contribution is due to current crowding at the metal/LSMO interface as already reported. The voltage contact contribution could be attributed to DC current circulation into the voltage contacts.