Synthesis and characterization of BNT thin films - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2014

Synthesis and characterization of BNT thin films

Résumé

Polycrystalline piezoelectric lead-free Bi0.5Na0.5TiO3 (abbreviated as BNT) thin films were deposited on glass substrates by an optimized Sol-Gel process using the Electrospray technique. X-ray Diffraction (XRD) analysis showed that after heating the films at 650˚C for 1 hour, dense and well crystallized BNT films in the rhombohedral perovskite phase were formed. Polyhedral shaped primary particles, with an average size of approximately 200 nm and a smooth surface of 1.8 nm average roughness (Ra), were detected using AFM analysis. The deconvolution of Raman spectrum had confirmed our first results of XRD about the crystallization of BNT films due to the appearance of Raman peaks corresponding to the bending vibrations of Bi-O, Na-O and TiO6 bonds.
Fichier non déposé

Dates et versions

hal-00974478 , version 1 (07-04-2014)

Identifiants

  • HAL Id : hal-00974478 , version 1

Citer

Sara Abou Dargham, Jihane Jabbour, Youssef Zaatar, Jamal Assaad, Antonio Khoury, et al.. Synthesis and characterization of BNT thin films. Lebanese Association for the Advancement of Science 20th International Science Conference, LAAS 20, 2014, Hadath, Lebanon. Session : Theoretical and Experimental Chemistry and Physics III, 474-475. ⟨hal-00974478⟩
131 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More