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Communication Dans Un Congrès Année : 2011

ADCs Dynamic Testing by Multiharmonic Sine Fitting Algorithms

Résumé

The paper investigates and compares the performances of two state-­of-­the-­art MultiHarmonic Sine Fitting (MHSF) algorithms when used in the dynamic testing of an Analog-­to-­Digital Converter (ADC). The influence of the initial estimate of the test signal frequency on the uncertainty of the estimated ADC dynamic parameters is analyzed by using computer simulations. Moreover, the accuracies of the considered MHSF algorithms and the sine-­fit algorithms suggested in the existing standards for ADCs testing are compared by means of both computer simulations and experimental results.
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Dates et versions

hal-00957283 , version 1 (10-03-2014)

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  • HAL Id : hal-00957283 , version 1

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Dominique Dallet, Daniel Belega, Dario Petri. ADCs Dynamic Testing by Multiharmonic Sine Fitting Algorithms. 2011 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design and IEEE 2011 ADC Forum, Jun 2011, Orvieto, Italy. pp.254-259. ⟨hal-00957283⟩
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