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Article Dans Une Revue Electronics Letters Année : 2014

Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

Résumé

A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.
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Dates et versions

hal-00954474 , version 1 (03-03-2014)

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S. Puthukodan, E. Dadrasnia, V.K.T. Vinod, H.K. Nguendon, H. Lamela, et al.. Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser. Electronics Letters, 2014, 50, pp.297-299. ⟨10.1049/el.2013.4136⟩. ⟨hal-00954474⟩
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