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Article Dans Une Revue Microelectronics Reliability Année : 2013

Impact of high frequency current ripple on supercapacitors ageing through floating ageing tests

Ali Sari
Pascal Venet
Younes Zitouni
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hal-00950564 , version 1 (21-02-2014)

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Ronan German, Olivier Briat, Ali Sari, Pascal Venet, Mohamed Ayadi, et al.. Impact of high frequency current ripple on supercapacitors ageing through floating ageing tests. Microelectronics Reliability, 2013, 53 (9-11), pp.1643-1647. ⟨10.1016/j.microrel.2013.07.030⟩. ⟨hal-00950564⟩
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