High reference impedance reflectometer for nonresonant matching of near-field microwave microscope tip probe - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microwave and Optical Technology Letters Année : 2014

High reference impedance reflectometer for nonresonant matching of near-field microwave microscope tip probe

Résumé

In this letter, we present a nonresonant high impedance reflectometer integrating a tip probe dedicated to near-field microwave microscopy. A 1-kohms reflectometer is fabricated by using lumped elements to validate the approach proposed to solve the problem of impedance mismatch between the probe and the measurement system.

Dates et versions

hal-00939056 , version 1 (30-01-2014)

Identifiants

Citer

D. Glay, A. El Fellahi, T. Lasri. High reference impedance reflectometer for nonresonant matching of near-field microwave microscope tip probe. Microwave and Optical Technology Letters, 2014, 56, pp.64-69. ⟨10.1002/mop.28018⟩. ⟨hal-00939056⟩
30 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More