High reference impedance reflectometer for nonresonant matching of near-field microwave microscope tip probe
Résumé
In this letter, we present a nonresonant high impedance reflectometer integrating a tip probe dedicated to near-field microwave microscopy. A 1-kohms reflectometer is fabricated by using lumped elements to validate the approach proposed to solve the problem of impedance mismatch between the probe and the measurement system.