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Article Dans Une Revue Journal of Low Power Electronics Année : 2014

Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits

Résumé

Recent studies have shown that integrated circuit aging modifies electromagnetic emission significantly. The proposed paper aims at evaluating the impact of aging on the power integrity and the conducted emission of digital integrated circuits, clarifying the origin of electromagnetic emission evolution and proposing a methodology to predict this evolution. On-chip measurements of power supply voltage bounces in a CMOS 90 nm technology test chip and conducted emission measurements are combined with electric stress to characterize the influence of aging. Simulations based on ICEM modeling modified by an empirical coefficient to model the evolution of the emission induced by device aging is proposed and tested.
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Dates et versions

hal-00938358 , version 1 (29-01-2014)

Identifiants

  • HAL Id : hal-00938358 , version 1

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Alexandre Boyer, Sonia Ben Dhia. Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. Journal of Low Power Electronics, 2014, 10 (1), pp.165-172. ⟨hal-00938358⟩
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