Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy - Archive ouverte HAL
Article Dans Une Revue Microelectronics Reliability Année : 2013

Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy

Résumé

Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out at different times, showing a decreasing and an increasing evolution of the red and the blue part of the spectrum, respectively. This evolution has been attributed to the diffusion and the reorganization of different silver species inside the matrix, altering the internal electric field. Stark effect based modeling enables the degradation mode of the memory.
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hal-00932228 , version 1 (08-03-2018)

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Arnaud Royon, Kevin Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, et al.. Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy. Microelectronics Reliability, 2013, 53 (9-11), pp.1514-1518. ⟨10.1016/j.microrel.2013.07.110⟩. ⟨hal-00932228⟩
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