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Article Dans Une Revue Intermetallics Année : 2014

On the use of atomic force microscopy for structural mapping of metallic-glass thin films

Résumé

In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra.

Domaines

Matériaux
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Dates et versions

hal-00925846 , version 1 (08-01-2014)

Identifiants

Citer

J.F. Zeng, J.P. Chu, Y.C. Chen, A. Volland, J.J. Blandin, et al.. On the use of atomic force microscopy for structural mapping of metallic-glass thin films. Intermetallics, 2014, 44, pp.121-127. ⟨10.1016/j.intermet.2013.09.006⟩. ⟨hal-00925846⟩
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