Growth of Si ultrathin films on silver surfaces: Evidence of an Ag(110) reconstruction induced by Si
Abstract
We report here in situ measurements of the evolution of the Ag(110) surface during Si growth, using scanning tunneling microscopy and grazing incidence x-ray diffraction. We provide compelling evidence of an Ag(110) surface reconstruction associated with the release of Ag atoms induced by the growth of Si nanoribbons. Our results are in agreement with a missing row reconstruction of the Ag layer underneath the nanoribbons. This challenges the current understanding of the Si growth on nonreconstructed Ag(110), interpreted within the framework of silicene models.
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