Scanning microwave near-field microscope based on the multiport technology - Archive ouverte HAL
Journal Articles IEEE Transactions on Instrumentation and Measurement Year : 2013

Scanning microwave near-field microscope based on the multiport technology

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https://hal.science/hal-00903759

Submitted on : Wednesday, November 13, 2013-8:33:25 AM

Last modification on : Thursday, January 25, 2024-3:38:18 AM

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hal-00903759 , version 1 (13-11-2013)

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Kamel Haddadi, T. Lasri. Scanning microwave near-field microscope based on the multiport technology. IEEE Transactions on Instrumentation and Measurement, 2013, 62, pp.3189-3193. ⟨10.1109/TIM.2013.2270918⟩. ⟨hal-00903759⟩

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