Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
Résumé
We present results of laser testing of radiation-induced single event burn-out (SEB) in two 600 V Silicon Carbide Schottky power diodes using two-photon absorption at blue wavelength. Transient currents and destructive events are observed and analyzed. A simple physical model of the laser induced current in the tested devices is proposed to evaluate the impact of experimental parameters on the occurrence of an SEB.