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Conference Papers Year : 2013

Interferometric technique for scanning near-field microwave microscopy applications

H. Bakli
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Kamel Haddadi
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hal-00877837 , version 1 (29-10-2013)

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H. Bakli, Kamel Haddadi, T. Lasri. Interferometric technique for scanning near-field microwave microscopy applications. IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, 2013, Minneapolis, MN, United States. pp.1694-1698, ⟨10.1109/I2MTC.2013.6555703⟩. ⟨hal-00877837⟩
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