Conference Papers
Year : 2013
Collection IEMN : Connect in order to contact the contributor
https://hal.science/hal-00877837
Submitted on : Tuesday, October 29, 2013-11:29:16 AM
Last modification on : Friday, March 24, 2023-2:52:57 PM
Cite
H. Bakli, Kamel Haddadi, T. Lasri. Interferometric technique for scanning near-field microwave microscopy applications. IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, 2013, Minneapolis, MN, United States. pp.1694-1698, ⟨10.1109/I2MTC.2013.6555703⟩. ⟨hal-00877837⟩
Collections
14
View
0
Download