Interferometric technique for scanning near-field microwave microscopy applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2013

Interferometric technique for scanning near-field microwave microscopy applications

H. Bakli
  • Fonction : Auteur
Kamel Haddadi
Fichier non déposé

Dates et versions

hal-00877837 , version 1 (29-10-2013)

Identifiants

Citer

H. Bakli, Kamel Haddadi, T. Lasri. Interferometric technique for scanning near-field microwave microscopy applications. IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, 2013, Minneapolis, MN, United States. pp.1694-1698, ⟨10.1109/I2MTC.2013.6555703⟩. ⟨hal-00877837⟩
19 Consultations
0 Téléchargements

Altmetric

Partager

More