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Article Dans Une Revue Microelectronics Reliability Année : 2013

Migration issues in sintered-silver die attaches operating at high temperature

Raphaël Riva
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Cyril Buttay
Pascal Bevilacqua

Résumé

Silver sintering is a promising alternative to high melting point (HMP) solders which contain lead. Indeed, it offers better thermal and electrical properties, and can operate at higher temperature. However, silver tends to migrate in presence of electric field, oxygen (or moisture) and high temperature, causing short circuits. In this paper, we assess the extend of this issue, and we evaluate the protective effect of a thin layer of parylene. It is shown that silver migration occurs rapidly (tens to hundred of hours at 300°C), but that parylene offers a good mitigation of this issue.
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Dates et versions

hal-00874458 , version 1 (17-10-2013)

Identifiants

Citer

Raphaël Riva, Cyril Buttay, Bruno Allard, Pascal Bevilacqua. Migration issues in sintered-silver die attaches operating at high temperature. Microelectronics Reliability, 2013, 53 (9-11), pp.1592-1596. ⟨10.1016/j.microrel.2013.07.103⟩. ⟨hal-00874458⟩
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