Review and comparison of goodness-of-fit tests for the exponential and Weibull distributions - Archive ouverte HAL
Communication Dans Un Congrès Année : 2012

Review and comparison of goodness-of-fit tests for the exponential and Weibull distributions

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hal-00850630 , version 1 (07-08-2013)

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  • HAL Id : hal-00850630 , version 1

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Meryam Krit, Olivier Gaudoin. Review and comparison of goodness-of-fit tests for the exponential and Weibull distributions. PSAM 11-ESREL 2012 - 11th International Probabilistic Safety Assessment and Management Conference and the Annual European Safety and Reliability Conference, Jun 2012, Helsinki, Finland. pp.1404-1413. ⟨hal-00850630⟩
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