Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface - Archive ouverte HAL Access content directly
Journal Articles Physical Review Letters Year : 2013

Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface

Thomas Jaouen
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Sylvain Tricot
Gabriel Delhaye
Bruno Lépine
Didier Sébilleau
Guy Jézéquel
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Abstract

By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4-6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility to control Mg atoms incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects, both band-offset variations at the interface and band bending effects in the oxide film.

Dates and versions

hal-00844344 , version 1 (16-01-2014)

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Thomas Jaouen, Sylvain Tricot, Gabriel Delhaye, Bruno Lépine, Didier Sébilleau, et al.. Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface. Physical Review Letters, 2013, 111 (2), pp.027601. ⟨10.1103/PhysRevLett.111.027601⟩. ⟨hal-00844344⟩
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