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Article Dans Une Revue Acta Physica Polonica A Année : 2011

Scanning-Gate Microscopy of Semiconductor Nanostructures: An Overview

Peng Liu
Serge Huant
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Résumé

This paper presents an overview of scanning-gate microscopy applied to the imaging of electron transport through buried semiconductor nanostructures. After a brief description of the technique and of its possible artifacts, we give a summary of some of its most instructive achievements found in the literature and we present an updated review of our own research. It focuses on the imaging of GaInAs-based quantum rings both in the low magnetic field Aharonov-Bohm regime and in the high-field quantum Hall regime. In all of the given examples, we emphasize how a local-probe approach is able to shed new, or complementary, light on transport phenomena which are usually studied by means of macroscopic conductance measurements.
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Dates et versions

hal-00834932 , version 1 (12-07-2022)

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F. Martins, B. Hackens, Hermann Sellier, Peng Liu, M. Pala, et al.. Scanning-Gate Microscopy of Semiconductor Nanostructures: An Overview. Acta Physica Polonica A, 2011, 119 (5), pp.569-575. ⟨10.12693/APhysPolA.119.569⟩. ⟨hal-00834932⟩
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