AlN/SI interfaces properties revealed by broadband characterization of coplanar waveguides - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2013

AlN/SI interfaces properties revealed by broadband characterization of coplanar waveguides

F. Boone
Maher, Hassan

Résumé

From the characterization of structure equivalent loss tangent under different conditions (bias and temperature) obtained through propagation constant and characteristic impedance extraction of CPW line, we propose a coherent analysis of the properties of an AlN/Si interface featured with a GaN on Si HEMT technology.
Fichier non déposé

Dates et versions

hal-00828412 , version 1 (31-05-2013)

Identifiants

  • HAL Id : hal-00828412 , version 1

Citer

Adrien Cutivet, Alain Agboton, Philippe Altuntas, François Lecourt, Marie Lesecq, et al.. AlN/SI interfaces properties revealed by broadband characterization of coplanar waveguides. 37th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe, WOCSDICE 2013, 2013, Warnemünde, Germany. pp.37-38. ⟨hal-00828412⟩
420 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More