Conference Papers
Year : 2013
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https://hal.science/hal-00820950
Submitted on : Tuesday, May 7, 2013-9:38:38 AM
Last modification on : Friday, March 24, 2023-2:52:57 PM
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- HAL Id : hal-00820950 , version 1
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N. Clement, K. Nishiguchi, A. Fujiwara, D. Vuillaume. Dielectric polarization 1/f noise in 0D MOS transistors and ion-sensitive field-effect transistors. 22nd International Conference on Noise and Fluctuations, ICNF 2013, 2013, Montpellier, France. ⟨hal-00820950⟩
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