In situ silicon-integrated tuner for automated on-wafer mmW noise parameters extraction using multi-impedance method for transistor characterization - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Semiconductor Manufacturing Year : 2012

In situ silicon-integrated tuner for automated on-wafer mmW noise parameters extraction using multi-impedance method for transistor characterization

Y. Tagro
  • Function : Author
N. Waldhoff
  • Function : Author
D. Gloria
  • Function : Author
S. Boret
  • Function : Author
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hal-00819467 , version 1 (01-05-2013)

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Y. Tagro, N. Waldhoff, D. Gloria, S. Boret, Gilles Dambrine. In situ silicon-integrated tuner for automated on-wafer mmW noise parameters extraction using multi-impedance method for transistor characterization. IEEE Transactions on Semiconductor Manufacturing, 2012, 25, pp.170-177. ⟨10.1109/TSM.2011.2181673⟩. ⟨hal-00819467⟩
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