Journal Articles
IEEE Transactions on Semiconductor Manufacturing
Year : 2012
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https://hal.science/hal-00819467
Submitted on : Wednesday, May 1, 2013-3:16:55 PM
Last modification on : Friday, March 24, 2023-2:52:57 PM
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Y. Tagro, N. Waldhoff, D. Gloria, S. Boret, Gilles Dambrine. In situ silicon-integrated tuner for automated on-wafer mmW noise parameters extraction using multi-impedance method for transistor characterization. IEEE Transactions on Semiconductor Manufacturing, 2012, 25, pp.170-177. ⟨10.1109/TSM.2011.2181673⟩. ⟨hal-00819467⟩
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